2D In-line Model

I Systems

Advanced Optical Intelligence

The intelligent I Systems automated Optical Inspection machine is designed to meet the most stringent demand of today's SMT environment.

A true exceptional inspection performance for Productivity and First-pass Yield is achieved with I Systems' Ultra fast line scan technology coupled with its sophisticated SPORTS inspection software.

Specifications

0.1ms inspection time/per window and a 12 sec* scan time

Speed

Capable to inspect 0201(0603) chips and 0.4mm lead pitch ICs.

User friendly algorithm programming method

Multi- color LED lighting and tele-centric lens provides the software accurate images to repeatedly defects with high first pass yield

SPC package with GR&R, CP, CPK, standard deviation values

Precision

Optimization

Repeatability

Traceability

1D/2D (QR, data matrix) Barcode reading function.

Synergy

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